An exact algorithm for selecting partial scan flip-flops
نویسندگان
چکیده
منابع مشابه
ATPG for scan chain latches and flip-flops
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking experiment to each bistable element in the circuit while checking their response. Such tests guarantee the detection of all detectable combinational defects inside the bistable elements. The algorithm is implemented by m...
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 1995
ISSN: 0923-8174,1573-0727
DOI: 10.1007/bf00993316